Aug. 27, 2025 We have presented our recent work at the RFIT (IEEE International Symposium on Radio-Frequency Integration Technology). Title: Wideband Noise Spectroscopy of Very Shallow States in Cryogenic MOSFETs
Mar. 15, 2025 第72回応用物理学会春季学術講演会において研究開発成果を発表しました 講演タイトル「MOSFET雑音の広帯域計測とその温度依存性に関する考察」
Dec. 25, 2022 We are pleased to announce our recent development of a noise measurement system for cryogenic electronics. Please check the preprint at IEEE TechRxiv for more detail.
May 14, 2021 We introduce our recent result on cryogenic broadband noise characterization (a presentation video at IEEE EDTM). We will aim to improve the temperature range further down to 4 K for the realization of a cryogenic RF-CMOS chip in quantum computing. 極低温環境下におけるMOSFEETの広帯域雑音計測に関して最近の成果を動画（EDTMでのプレゼンテーションビデオ）でご覧いただけます。更に開発を進めて4Kでの計測を可能にし、大規模量子コンピューティングにおける要素技術の確立を目指します。
April 23, 2021 SimYog Technology EMI/EMCシミュレータのパンフレット（英語版）を更新しました。
Jan 21, 2021 Our paper entitled “White Noise Characterization of N-MOSFETs for Physics-Based Cryogenic Device Modeling” has been nominated for the Best Paper Award of IEEE EDTM 2021.
Jan 7, 2021 A PDF copy of the submitted abstract for EDTM 2021 is now downloadable at TechRxiv. The wideband noise measurement of MOSFETs in the temperature range from 300 K down to 120 K has been successfully demonstrated, aiming for predictive device modeling in a cryogenic CMOS circuit of quantum computing.
Dec 23, 2020 We are happy to announce that our recent development for quantum computing will be presented at EDTM 2021. The paper is entitled “White Noise Characterization of N-MOSFETs for Physics-Based Cryogenic Device Modeling”.
Dec 7, 2020 We have uploaded our recent result using Entrope®︎ Noise Probe to TechRxiv Preprint Server. “Direct white noise characterization of short-channel MOSFETs”
Oct 2, 2019 We will attend SWTest Asia, the premier wafer test technology conference, from October 17th to 18th held in Hsinchu, Taiwan. Come visit our exhibition booth (Booth #222 with Shyan Sheng HiTech Co., Ltd.). 10月17日〜18日に台湾新竹市で開催される半導体ウェハテストの展示会（SWTest Asia）に出展します。台湾の販売エージェンシーである賢昇科技（股）公司との共同出展です（ブース番号#222）。
June 5, 2017 VLSI Symposium on Technologyにおいて発表する研究成果が筑波大学からプレスリリースされました
May 23, 2017 Device Lab Inc. was financed by Japan Finance Corporation. 株式会社デバイスラボが日本政策金融公庫の挑戦支援資本強化特例制度による資金調達を実施いたしました
April 18, 2017 Dr. Ohmori, CEO, will present a result on ReRAM variability at VLSI Symposium on Technology. Session: T7-1 (June 7, wed) Tittle: “Reduction of Cycle-to-Cycle Variability in ReRAM by Filamentary Refresh”
