Noise Probe

Demonstration of Entrope®︎ Noise Probe available at TechRxiv Preprint Server

Also, there is some literature about the High-Frequency Noise Probe in the early development stage. For details, please see below.

1. Kenji Ohmori, Ryu Hasunuma, Satoshi Yamamoto, Yoshinori Tamura, Hao Jiang, Noboru Ishihara, Kazuya Masu, and Keisaku Yamada
   “Application of Low-Noise TIA ICs for Novel Sensing of MOSFET Noise up to the GHz Region”
   VLSI Symposium on Circuits, June 11-14, 2013, Kyoto, Japan.
2. K. Ohmori, Ryu Hasunuma, Wei Feng, and Keisaku Yamada
   “Continuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz”
   VLSI Symposium on Technology, June 12-14, 2012, Hawaii, USA.
3. 大毛利健治、山田啓作
   「MOSFETの雑音特性を計測する新手法を開発」
   日経エレクトロニクス 2013年11月25日号 pp. 87-93.